## Abstract We believe that reduction of the testing cost is becoming increasingly important as the size of VLSIs becomes larger. Moreover, as the structure of VLSIs becomes more complicated, test compaction, test compression, and test application time reduction for nonβstuckβat faults, such as del
β¦ LIBER β¦
Attribute reduction of data with error ranges and test costs
β Scribed by Fan Min; William Zhu
- Book ID
- 113662425
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 537 KB
- Volume
- 211
- Category
- Article
- ISSN
- 0020-0255
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