✦ LIBER ✦

Atomistic model of electric stress induced defect generation in silicon oxide

✍ Scribed by Anatoli A. Korkin; Gennadi I. Bersuker; Howard R. Huff

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Investigation of electrically active def

✍ Aveek Chatterjee; Asha Bhat; Kevin Matocha 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 535 KB

Spectroscopic analysis of stress-induced

✍ Kenji Komiya; Yasuhisa Omura 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 157 KB

Instability of charged defects in electr

✍ Per Lundgren; Mats O. Andersson; K.R. Farmer; Olof Engström 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 275 KB

Atomistic modeling of ion beam induced a

✍ Lourdes Pelaz; Luis A. Marqués; Maria Aboy; Juan Barbolla 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 258 KB

Atomistic modeling of ion beam induced a

✍ Lourdes Pelaz; Luis A. Marqués; Pedro López; Iván Santos; María Aboy; Juan Barbo 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 194 KB

Effect of Stress Induced Defects on Elec

✍ Misiuk, Andrzej; Jung, W.; Surma, Barbara; Jun, J.; Rozental, M. 📂 Article 📅 1997 🏛 Trans Tech Publications, Ltd. 🌐 English ⚖ 416 KB