๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Atomic force microscopy: Pinning down the thickness of twin walls

โœ Scribed by Salje, E. K. H.; Lee, W. T.

Book ID
109933497
Publisher
Nature Publishing Group
Year
2004
Tongue
English
Weight
286 KB
Volume
3
Category
Article
ISSN
1476-1122

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Measuring the relative interface thickne
Measuring the relative interface thickness of multilayer polyolefin films with atomic force microscopy
โœ Rajesh P. Paradkar; Jing Li; Georg Bar; Hoang Pham; Clive Bosnyak; Jeffrey Weinh ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 838 KB

## Abstract In any polymer blend system, the nature and thickness of the polymer interface can have a significant influence on the overall performance of the blend. Consequently, it is important to understand the nature of the interactions between the various blend components to effectively design

The lamellar thickness of melt crystalli
The lamellar thickness of melt crystallized isotactic polystyrene as determined by atomic force microscopy
โœ S.J. Sutton; K. Izumi; H. Miyaji; K. Fukao; Y. Miyamoto ๐Ÿ“‚ Article ๐Ÿ“… 1996 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 385 KB

Atomic force microscopy has been used to investigate the morphology of isotactic polystyrene lamellae growth from the melt in very thin films (~ 50 nm in thickness). It is shown that atomic force microscopy can elucidate the crystal morphology and provide quantitative measurements of the step height