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The lamellar thickness of melt crystallized isotactic polystyrene as determined by atomic force microscopy

✍ Scribed by S.J. Sutton; K. Izumi; H. Miyaji; K. Fukao; Y. Miyamoto


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
385 KB
Volume
37
Category
Article
ISSN
0032-3861

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✦ Synopsis


Atomic force microscopy has been used to investigate the morphology of isotactic polystyrene lamellae growth from the melt in very thin films (~ 50 nm in thickness). It is shown that atomic force microscopy can elucidate the crystal morphology and provide quantitative measurements of the step height (between successive crystal layers of a spiral overgrowth terrace) corresponding to the long spacing, provided suitable procedures are employed.


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