Atomic force microscopy in conjunction with the colloid (silica) probe technique has been used to quantify the variations in electrical double-layer interactions and adhesion at different locations on a rough reverse osmosis membrane (AFC99) surface in NaCl solutions. Prior scanning of the membrane
โฆ LIBER โฆ
Atomic force microscopy studies of conditioner thickness distribution and binding interactions on the hair surface
โ Scribed by N. CHEN; B. BHUSHAN
- Book ID
- 108864150
- Publisher
- John Wiley and Sons
- Year
- 2006
- Tongue
- English
- Weight
- 534 KB
- Volume
- 221
- Category
- Article
- ISSN
- 0022-2720
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