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Atomic force microscopy and Raman spectroscopy studies on the oxidation of Cu thin films

โœ Scribed by Gong, Y. S.; Lee, Chiapyng; Yang, C. K.


Book ID
121084569
Publisher
American Institute of Physics
Year
1995
Tongue
English
Weight
734 KB
Volume
77
Category
Article
ISSN
0021-8979

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