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Atomic force microscope featuring an integrated optical microscope

✍ Scribed by Constant A.J. Putman; Kees O. van der Werf; Bart G. de Grooth; Niek F. van Hulst; Frans B. Segerink; Jan Greve

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
756 KB
Volume
42-44
Category
Article
ISSN
0304-3991

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