Direct Measurement of the Depletion Force Using an Atomic Force Microscope
โ Scribed by Andrew Milling; Simon Biggs
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 154 KB
- Volume
- 170
- Category
- Article
- ISSN
- 0021-9797
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
An atomic force microscope has been used to quantify directly the adhesion between single Aspergillus niger spores and freshly cleaved mica surfaces. The measurements used "spore probes" constructed by immobilizing a single spore at the apex of a tipless AFM cantilever. Adhesion was quantified from
The interaction forces provided by silicone polyether (SPE) surfactants, adsorbed at the interface of octadecyltrichlorosilan monolayer and aqueous surfactant solution, were measured by atomic force microscopy. Changes in the forces in the presence of ethanol were examined for a series of comb-type
The effect of polydispersity in macromolecule size or surface potential on the depletion interaction between a spherical silica particle and a silica flat in solutions containing two different types of nonadsorbing charged spherical macromolecules was studied with an atomic force microscope (AFM). T
Sub-100 nm V-grooves in GaAs(001) surfaces have been fabricated by patterning a thin photoresist layer with an atomic force microscope (AFM) and subsequent wet-chemical etching. The nanolithography is based on the dynamic ploughing technique. Anisotropic etchants under investigation are bromine-meth