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Direct Measurement of Repulsive van der Waals Interactions Using an Atomic Force Microscope

✍ Scribed by Andrew Milling; Paul Mulvaney; Ian Larson

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 102 KB
Volume: 180
Category: Article
ISSN: 0021-9797
DOI: 10.1006/jcis.1996.0326

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