✦ LIBER ✦

Applications of ion-implanted passivated silicon detectors to x-ray analysis

✍ Scribed by Marie Odile Lampert; Corentin Peuziat

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 236 KB
Volume: 226
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(84)90168-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Industrial applications of passivated io

Industrial applications of passivated ion-implanted silicon detectors

✍ P. Burger; Y. Beroud 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 262 KB

Double-crystal X-ray diffraction analysi

Double-crystal X-ray diffraction analysis of low-temperature ion implanted silicon

✍ F. Cembali; M. Servidori; A. Zani 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 858 KB

Evaluation of passivated ion implanted p

Evaluation of passivated ion implanted planar silicon detectors for the spectroscopy and assay of low energy electrons

✍ Jonathan Robert Batten 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 514 KB

The application of high energy ion impla

The application of high energy ion implantation for silicon radiation detectors

✍ J. von Borany; B. Schmidt; R. Grötzschel 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 503 KB

Investigation of avalanche silicon detec

Investigation of avalanche silicon detectors for low energy single ion implantation applications

✍ Changyi Yang; David Jamieson 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 281 KB

Applications of x-ray microfluorescence

Applications of x-ray microfluorescence to materials analysis

✍ George J. Havrilla 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 760 KB

X-ray microÑuorescence provides the analytical scientist with a powerful tool to solve a variety of materials-based problems. Spatially resolved non-destructive elemental analyses can rapidly address a number of problems using qualitative analysis. Point spectra, line proÐles and elemental maps o †e