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Evaluation of passivated ion implanted planar silicon detectors for the spectroscopy and assay of low energy electrons

✍ Scribed by Jonathan Robert Batten

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 514 KB
Volume: 277
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(89)90778-x

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