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A computer-aided simulation model for the I–V characteristic of M-n-p silicon Schottky-barrier diodes produced by use of low-energy arsenic-ion implantation: Ching-Yuan Wu, Ming-Chein Chang and An-Jui Shey. Solid-St. Electron.26 (9), 893 (1983)


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
207 KB
Volume
24
Category
Article
ISSN
0026-2714

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