Applications of image processing for surface characterization and depth profiling with SIMS
โ Scribed by F. Michiels; W. Vanhoolst; W. Jacob; P. Van Espen; F. Adams
- Book ID
- 108014932
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 117 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0739-6260
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
In this paper, ionization processes of secondary ions during ToF-SIMS dual beam depth profiling were studied by co-sputtering with 500 eV cesium and xenon ions and analyzing with 25 keV Ga + ions. The Cs/Xe technique consists in diluting the cesium sputtering/etching beam with xenon ions to control
A polymerizable derivative of galactose, a thioglycoside with an acryloyl group in the aglycone sidechain, has been prepared and copolymerized with methyl methacrylate to produce colloidal latex particles for possible use in biomedical applications. The surface chemistry of these copolymer latex par