✦ LIBER ✦
Image depth profiling SIMS: An evaluation for the analysis of light element diffusion for the analysis of light element diffusion in YBa2 Cu3O7–x single-crystal superconductors
✍ Scribed by Greg Gillen; Debra L. Kaiser; Jay S. Wallace
- Publisher
- John Wiley and Sons
- Year
- 1991
- Tongue
- English
- Weight
- 897 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0142-2421
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