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XPS for non-destructive depth profiling and 3D imaging of surface nanostructures

✍ Scribed by Shaaker Hajati; Sven Tougaard

Publisher: Springer
Year: 2010
Tongue: English
Weight: 514 KB
Volume: 396
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s00216-009-3401-9

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