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Application of thermal models in production measurements of semiconductor devices

✍ Scribed by A. Nowakowski; J. Gajkiewicz

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 323 KB
Volume: 7
Category: Article
ISSN: 0263-2241
DOI: 10.1016/0263-2241(89)90004-3

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