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Modelling of velocity overshoot in submicron semiconductor devices

✍ Scribed by A.M. Ibrahim; Magdy M. Ibrahim


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
143 KB
Volume
35
Category
Article
ISSN
0038-1101

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Within the next decade or so, it is expected that gate lengths will shrink to 50 nm or less in devices found in integrated circuits. At the same time, the thermal de Broglie wavelength for electrons in Si at 300 K is some 5 nm. How might we expect quantum mechanics to arise in the transport through