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Application of Surface Roughness Data for the Evaluation of Depth Profile Measurements of Nanoscale Multilayers

✍ Scribed by Bartók, András; Csik, Attila; Vad, Kálmán; Molnár, György; Tóth-Kádár, Enikő; Péter, László

No coin nor oath required. For personal study only.

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