๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Application of ion beams in the study of depth profiling of nitrogen

โœ Scribed by Lakshmanan H. Vanamurthy; Arthur W. Haberl; Hassaram Bakhru


Book ID
108223949
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
237 KB
Volume
261
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Ion-beam depth-profiling studies of leac
โœ Houser, C. A. ;Tsong, I. S. T. ;White, W. B. ;Wintenberg, A. L. ;Miller, P. D. ; ๐Ÿ“‚ Article ๐Ÿ“… 1982 ๐Ÿ› Informa UK (Taylor & Francis) โš– 426 KB
Depth profiling of light elements in mat
๐Ÿ“‚ Article ๐Ÿ“… 1978 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 175 KB

Classified abstracts 3356-3363 flood gun capable of removing the charge shifts from the passivation (insulator) layers. The study demonstrates the feasibility of ESCA as a tool for industrial metallurgical problems. T L Parr, J Vuc Sci Technol, 14 (l), 1977,664L665. Morphologies of Pt catalyst surf