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Diffusion studies in polymer melts by ion beam depth profiling of hydrogen

โœ Scribed by Peter F Green; Peter J Mills; Edward J Kramer

Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
411 KB
Volume
27
Category
Article
ISSN
0032-3861

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Ion beam analysis (IBA) methods were used for the characterization of interdiffusion in thin Au-A1 multilayered systems. Conventional RBS with a high depth resolution at the specimen surface and at the interfaces (e.g. 14 nm in the depth of 255 nm) was used for gold depth profiling. In contrast to g