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Application of hillock etching of microdefects to the investigation of Czochralski silicon by transmission electron microscopy

โœ Scribed by Weidner, G.

Publisher
John Wiley and Sons
Year
1978
Tongue
English
Weight
146 KB
Volume
48
Category
Article
ISSN
0031-8965

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We developed a method for the preparation of ultrathin longitudinal sections of chromosomes enabling TEM studies of whole chromosomes. By using a novel "repeat chill" method of exposing the glass slide and plastic block interface to liquid nitrogen, it was possible to separate consistently hardened