Characterization of the microstructure o
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M.F. Denanot; J. Rabier
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Article
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1989
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Elsevier Science
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English
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Aluminium nitride samples sintered with various Y20: concentrations are characterized by transmission electron microscopy. Topology and second phase characteristics at grain boundaries are investigated by X-ray and diffraction experiments. At low Y:O~ concentrations (up to 10%) second phases (mainly