๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Anodic oxide films on titanium

โœ Scribed by Ulf Rolander; Lars Mattsson; Jukka Lausmaa; Bengt Kasemo


Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
95 KB
Volume
19
Category
Article
ISSN
0304-3991

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Reversible reactions within anodic oxide
โœ C.K. Dyer; J.S.L. Leach ๐Ÿ“‚ Article ๐Ÿ“… 1978 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 851 KB

Evidence is preseoted for a reversible reaction occurring within the bulk of the surface oxide She on Ti electrodes at negative poteutials. Higb frequency impedance measurements give results characteristic of a buIk phenomenon and clearly distinguish the behaviour of filmed Ti electrodes from that o

Potential modulated reflectance spectros
โœ D.J. Blackwood; L.M. Peter ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 775 KB

Ahtract-Potential modulated reflectance (PMR) spectroscopy has been used to mvestlgate thm anodlc oxide films formed on tltamum m sulphunc acid The ongm of the reflectance modulation IS dlscussed and the expenmental results are compared with theoretlcal calculations based on the three layer model Th

The influence of growth rate on the prop
โœ D.J. Blackwood; L.M. Peter ๐Ÿ“‚ Article ๐Ÿ“… 1989 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 639 KB

Impedance measurements and photocurrent spectroscopy have been used to examine the dependence on growth rate of the solid state properties of thin ( -c 20 nm) anodic oxide films on titanium. At room temperature, the relative permittivity and defect concentration profiles in the oxide were found to d

The photoelectrochemistry of thin passiv
โœ F. Di Quarto; S. Piazza; C. Sunseri ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 676 KB

Abatraet-A photoelectrochemical investigation has been performed on thin TiO, films grown anodically in 0.5 M H,SO, solution at high growth rates. The shape of the photocurrent vs. potential curves under monochromatic irradiation (photocharacteristics) depends on the photon energy of the incident li