The carbon, sulphur and boron contents of anodic ZrG, films formed in 0.1 M sodium carbonate, 0.1 M sulphuric acid and saturated ammonium borate solutions respectively have been determined. These impurity elements are distributed uniformily on a 2-3 ,em scale in the plane of the film. Over-all impur
Anodic oxide films on silicon carbide
β Scribed by S. K. Lilov
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 104 KB
- Volume
- 42
- Category
- Article
- ISSN
- 0232-1300
No coin nor oath required. For personal study only.
β¦ Synopsis
Abstract
Anodic oxide films were grown on SiC using various electrolytes. The obtained oxide films were compared and some of their electrophysical properties were investigated. Anodic oxidation of SiC was shown to be useful for precise removal of layers as well as for identification of the polar faces of SiC crystals. (Β© 2007 WILEYβVCH Verlag GmbH & Co. KGaA, Weinheim)
π SIMILAR VOLUMES
The physico-chemical properties of the anodic niobium oxide films grown potentiodynamically in 1M Na CO solutions were studied. Capacj ' ty measurements and Schottky-Mott plots wer $ obtained for different thicknesses. A phenomenological description of the oxide film behaviour is reported.
Evidence is preseoted for a reversible reaction occurring within the bulk of the surface oxide She on Ti electrodes at negative poteutials. Higb frequency impedance measurements give results characteristic of a buIk phenomenon and clearly distinguish the behaviour of filmed Ti electrodes from that o
## Silicon Oxidation Techniques One of the properties that makes silicon the elephant in the zoo of semiconducting materials used in microelectronic manufacturing is the superior dielectric properties of its oxide [So1]. An SiO 2 layer can be formed by a simple thermal oxidation process in a wet (
Ahtract-Potential modulated reflectance (PMR) spectroscopy has been used to mvestlgate thm anodlc oxide films formed on tltamum m sulphunc acid The ongm of the reflectance modulation IS dlscussed and the expenmental results are compared with theoretlcal calculations based on the three layer model Th