Changes in the thermal oxidation of zirconium due to the presence of an initial electrolyticallyformed oxide layer are studied. The increase in thickness of the oxide on heating is measured optically and gravimetrically. The effect of the initial layer is the same as if it had been produced thermall
Anion impurities in anodic oxide films on zirconium
β Scribed by G.T. Rogers; P.H.G. Draper; S.S. Wood
- Publisher
- Elsevier Science
- Year
- 1968
- Tongue
- English
- Weight
- 832 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0013-4686
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β¦ Synopsis
The carbon, sulphur and boron contents of anodic ZrG, films formed in 0.1 M sodium carbonate, 0.1 M sulphuric acid and saturated ammonium borate solutions respectively have been determined. These impurity elements are distributed uniformily on a 2-3 ,em scale in the plane of the film. Over-all impurity contents are determined by the ionic formation cd. The variation of content with cd is different for each anion. Carbon and sulphur are not distributed uniformly in depth but concentrate towards the oxide/solution interface. Sulphur contents are an order of magnitude greater than those of tantalum and tungsten films formed under similar conditions. Carbon sulphur and boron effect the ionic conductivity of the film similarly. effective in increasing formation current efficiency;
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## Abstract Anodic oxide films were grown on SiC using various electrolytes. The obtained oxide films were compared and some of their electrophysical properties were investigated. Anodic oxidation of SiC was shown to be useful for precise removal of layers as well as for identification of the polar