The bars were then anodized in 1% KOH solution at room temperature to produce "stepgages." This was done by dividing each bar into l-cm sections on which successively increasing oxide film thicknesses were produced by anodizing from 0 to 150 V in 10-V increments. Each section was held at voltage one
The influence of anodic oxide films on the thermal oxidation of zirconium
β Scribed by J.J Polling; A Charlesby
- Publisher
- Elsevier Science
- Year
- 1954
- Weight
- 946 KB
- Volume
- 2
- Category
- Article
- ISSN
- 0001-6160
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β¦ Synopsis
Changes in the thermal oxidation of zirconium due to the presence of an initial electrolyticallyformed oxide layer are studied. The increase in thickness of the oxide on heating is measured optically and gravimetrically. The effect of the initial layer is the same as if it had been produced thermally, i.e., there is no difference in the oxidation behaviour of two specimens covered with initial oxide films of the same thickness, one of which has been grown electrolytically and the other thermally.
The growth of the oxide layer is approximately logarithmic up to temperatures of about 26O"C, cubic at 36O"C, and at higher temperatures it tends towards a quadratic function of time. For thick films there is a linear law probably due to cracking of the oxide. These rates of growth are in agreement with theoretical calculations based on the oxidation theory of Mott. L'INFLUENCE DE FILMS D'OXYDE ANODIQUE SUR L'OXYDATION THERMIQUE DU ZIRCONIUM On a &die les modifications dans l'oxydation thermique du zirconium, dues & la pr&ence d'une couche initiale d'oxyde form&e dlectrolytiquement. L'accroissement de l'epaisseur de l'oxyde lors du chauffage est mesure optiquement et gravimetriquement. L'effet de la couche initiale est identique a celui entre P ui serait produit par une couche form&e thermiquement! c'est-a-dire il n'y a pas de diff&nce oxydation de deux echantillons, dont un est couvert inttralement d'une couche form&e thermiquement et l'autre ~l~trolytiquement, les deux couches ayant la m&me Bpaisseur. La croissance d'une couche d'oxyde est logarithmique jusqu'& une tempekature d'environ 26O"C, elle devient cubique il 300Β°C, et aux temperatures plus elevees elle tend vers une fonction du second degre du temps. Dans le cas de couches epaisses la loi de croissance devient lineaire, probablement il. cause de la fissuration de l'oxyde. Ces vitesses de croissance sont en accord avec les calculs theoriques, bases sur la th&orie d'oxydation de Mott, DER EINFLUSS ANODISCHER OXYDFILME AUF DIE THERMISCHE OXYDATION VON ZIRKON Die durch die Anwesenheit eines ersten, elektrolytisch erzeugten Oxydfilmes hervorgerufenen iinderungen in der therm&hen Oxydation von Zirkon werden untersucht. Die wahrend der Er-w&mung auftretende Dickenzunahme der Oxyde wurde optisch und gravimetrisch gemessen. Die Wirkung dieses ersten Filmes gleicht der eines thermisch erzeugten, d.h. zwei Proben, die mit Anfangsoxydhlmen gleicher Dicke iiberzogen sind, zeigen in ihrem Oxydationaverhalten keine Unterschiede, wenn einer der Anfangsfilme elektrolytsich und der andere therm&h erzeugt worden war.
Das Wachstum der Oxydschicht ist bei Temperaturen bis zu etwa 260Β°C eine lo 309Β°C eine kubische und bei hoheren Temperaturen eine annahernd quadratisc a arithmische, bei e Funktion der Zeit. Bei dicken Filmen findet man eine lineare Abhangigkiet, was wahrscheinlich auf Aufbrechen der Oxydschicht zuriickzufiihren ist. Diese Wachstumsgeschwindigkeiten stimmen mit den theoretischen, auf Mott's Theorie der Oxydation beruhenden, Berechnungen iiberein.
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It has been shown previously that the kinetics of anodic film growth on Ta, Nb and Zr often depend strongly on the nature of the electrolyte. This work is an attempt to resolve this anomaly and the inconsistencies in the reported structures of the oxide layers. Electron diffraction showed the anodic