Annealing study of a bistable cluster defect
β Scribed by Alexandra Junkes; Doris Eckstein; Ioana Pintilie; Leonid F. Makarenko; Eckhart Fretwurst
- Book ID
- 103857992
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 430 KB
- Volume
- 612
- Category
- Article
- ISSN
- 0168-9002
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π SIMILAR VOLUMES
High resolution Laplace deep level transient spectroscopy (LDLTS) has been applied to investigate the annealing behaviour of small cluster defects in n-type Si. The Si was implanted with either Ge or Si, with energies 1500 keV and 850 keV respectively, and doses of 1 β’ 10 10 cm Γ2 . The low dose ens
## Abstract **BACKGROUND:** Investigations of clusters of birth defects have been challenging endeavors that have had only modest success identifying causes or risk factors. Some of the challenges to individual cluster investigations have been small sample size and limited data collection. We descr