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Annealing-induced full amorphization in a multicomponent metallic film

✍ Scribed by Chu, J. P.; Liu, C. T.; Mahalingam, T.; Wang, S. F.; O’Keefe, M. J.; Johnson, B.; Kuo, C. H.

Book ID
125843360
Publisher
The American Physical Society
Year
2004
Tongue
English
Weight
261 KB
Volume
69
Category
Article
ISSN
1098-0121

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The annealing-induced amorphization of a sputtered glass-forming Cu 51 Zr 42 Al 4 Ti 3 thin film has been clarified by in-situ transmission electron microscopy in conjunction with ex-situ atomic force microscopy and X-ray diffractometry. Upon heating of the film at low temperatures, nanocrystallizat