The structural, electrical and optical properties of AgGa(Se 0.5 S 0.5 ) 2 thin films deposited by using the thermal evaporation method have been investigated as a function of annealing in the temperature range of 450-600 °C. X-ray diffraction (XRD) analysis showed that the structural transformation
Annealing effects on structural, optical and electrical properties of e-beam evaporated CuIn0.5Ga0.5Te2 thin films
✍ Scribed by Koray Yılmaz; Hakan Karaagac
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 765 KB
- Volume
- 256
- Category
- Article
- ISSN
- 0169-4332
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