𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Annealing effects on electrical, structural, and surface morphological properties of Ir/n-InGaN Schottky structures

✍ Scribed by Reddy, V. Rajagopal ;Padma, R. ;Reddy, M. Siva Pratap ;Choi, C.-J.


Book ID
112181093
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
786 KB
Volume
209
Category
Article
ISSN
0031-8965

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Structural, electrical, and surface morp
✍ Reddy, V. Rajagopal ;Reddy, D. Subba ;Naik, S. Sankar ;Choi, C.-J. 📂 Article 📅 2011 🏛 John Wiley and Sons 🌐 English ⚖ 884 KB

## Abstract We have investigated the electrical and structural properties of Pt/Ti metallization scheme on n‐type InP as a function of annealing temperature using current–voltage (__I__–__V__), capacitance–voltage (__C__–__V__), Auger electron spectroscopy (AES), and X‐ray diffraction (XRD) measure

Structural and electrical properties of
✍ Jyothi, I. ;Reddy, V. Rajagopal ;Reddy, M. Siva Pratap ;Choi, Chel-Jong ;Bae, Jo 📂 Article 📅 2010 🏛 John Wiley and Sons 🌐 English ⚖ 564 KB

## Abstract Thermal annealing effects on the electrical and structural properties of Ni/Mo Schottky contacts on n‐type GaN have been investigated by current–voltage (__I–V__), capacitance–voltage (__C–V__), Secondary ion mass spectrometer (SIMS), and X‐ray diffraction (XRD) techniques. The extracte

Effect of rapid thermal annealing on the
✍ Janardhanam, V. ;Kumar, A. Ashok ;Reddy, M. Bhaskar ;Reddy, V. Rajagopal ;Reddy, 📂 Article 📅 2009 🏛 John Wiley and Sons 🌐 English ⚖ 817 KB

## Abstract The effects of rapid thermal annealing on the electrical and structural properties of Ru/n‐InP Schottky diode have been investigated by current–voltage (__I__–__V__), capacitance–voltage (__C__–__V__), X‐ray diffraction (XRD) and secondary ion‐mass spectroscopy (SIMS) techniques. Result