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Annealing effect on the electrical properties and microstructure of embedded Ni–Cr thin film resistor

✍ Scribed by Lifei Lai; Wenjin Zeng; Xianzhu Fu; Rong Sun; Ruxu Du


Book ID
116609371
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
968 KB
Volume
538
Category
Article
ISSN
0925-8388

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