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Effects of annealing temperature on microstructure and electrical properties of Mn–Co–Ni–O thin films

✍ Scribed by L. He; Z.Y. Ling; Y.T. Huang; Y.S. Liu


Book ID
113794410
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
641 KB
Volume
65
Category
Article
ISSN
0167-577X

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