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Annealing behavior of spin density in UHV evaporated amorphous silicon

โœ Scribed by Takao Yonehara; Toshio Saitoh; Hiroshi Kawarada; Tohru Hirata; Masakazu Kakumu; Iwao Ohdomari

Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
258 KB
Volume
78
Category
Article
ISSN
0375-9601

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๐Ÿ“œ SIMILAR VOLUMES

Anomalous annealing behavior of isolated
Anomalous annealing behavior of isolated amorphous zones in silicon
โœ S.E. Donnelly; R.C. Birtcher; V.M. Vishnyakov; P.D. Edmondson; G. Carter ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 141 KB

The formation and annealing of individual amorphous zones in silicon have been studied using in situ transmission electron microscopy. This technique enables us to identify anomalous behavior that cannot be deduced from statistical studies. Zones were formed at room temperature by impacts of single