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Analytical modeling of thermal noise in deep submicron MOSFETs

✍ Scribed by Zhi-Qiang Lu; Feng-Chang Lai

Publisher: Springer
Year: 2008
Tongue: English
Weight: 346 KB
Volume: 59
Category: Article
ISSN: 0925-1030
DOI: 10.1007/s10470-008-9248-8

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