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Analytical and Finite-Element Modeling of a Two-Contact Circular Test Structure for Specific Contact Resistivity

✍ Scribed by Pan, Y.; Reeves, G. K.; Leech, P. W.; Holland, A. S.

Book ID: 119952585
Publisher: IEEE
Year: 2013
Tongue: English
Weight: 640 KB
Volume: 60
Category: Article
ISSN: 0018-9383
DOI: 10.1109/TED.2013.2242076

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