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Analytical and Finite-Element Modeling of a Cross Kelvin Resistor Test Structure for Low Specific Contact Resistivity

✍ Scribed by Holland, A.S.; Reeves, G.K.; Bhaskaran, M.; Sriram, S.


Book ID
114619751
Publisher
IEEE
Year
2009
Tongue
English
Weight
637 KB
Volume
56
Category
Article
ISSN
0018-9383

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