✦ LIBER ✦

Analysis of the subthreshold current of pocket or halo-implanted nMOSFETs

✍ Scribed by Hueting, R.J.E.; Anco Heringa

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of soft breakdown in th

✍ Crupi, F.; Iannaccone, G.; Crupi, I.; Degraeve, R.; Groeseneken, G.; Maes, H.E. 📂 Article 📅 2001 🏛 IEEE 🌐 English ⚖ 86 KB

90 nm device validation of the use of a

✍ S.B. Felch; M.A. Foad; C. Olsen; F. Nouri; Y. Matsunaga; N. Natsuaki 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 136 KB

Subthreshold performance of pocket-impla

✍ Chakraborty, S.; Mallik, A.; Sarkar, C.K. 📂 Article 📅 2011 🏛 The Institution of Engineering and Technology 🌐 English ⚖ 860 KB

Analysis and modeling of the gate leakag

✍ E. Miranda; T. Kawanago; K. Kakushima; J. Suñé; H. Iwai 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 526 KB

Numerical Analysis of TVS Ionic Current

✍ Piprek, J. 📂 Article 📅 1989 🏛 John Wiley and Sons 🌐 English ⚖ 556 KB

Influence of straggling on the analysis

✍ E. Friedland 📂 Article 📅 1978 🏛 Elsevier Science ⚖ 214 KB