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Analysis of the influence of spatially localized oxide traps on the capacitance of MIS tunnel diodes

โœ Scribed by Nannini, Andrea ;Bagnoli, Paolo Emilio


Book ID
112089465
Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
752 KB
Volume
1
Category
Article
ISSN
1124-318X

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