Extraction of the Capacitance of a Metal Oxide Semiconductor Tunnel Diode (MOSTD) Biased in Accumulation

✍ Scribed by Matsumura, Mieko; Hirose, Yutaka

• Book ID: 124098650
• Publisher: Institute of Pure and Applied Physics
• Year: 1999
• Tongue: English
• Weight: 67 KB
• Volume: 38
• Category: Article
• ISSN: 0021-4922
• DOI: 10.1143/JJAP.38.L845