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Determination of quasi-Fermi level at the metal–semiconductor interface in a forward-biased schottky barrier diode

✍ Scribed by Simeonov, S. S. ;Ivanovitch, M. D.


Publisher
John Wiley and Sons
Year
1983
Tongue
English
Weight
368 KB
Volume
80
Category
Article
ISSN
0031-8965

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