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Analysis of the effect of the gate oxide breakdown on SRAM stability

✍ Scribed by R. Rodrı́guez; J.H. Stathis; B.P. Linder; S. Kowalczyk; C.T. Chuang; R.V. Joshi; G. Northrop; K. Bernstein; A.J. Bhavnagarwala; S. Lombardo

Book ID
108361929
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
559 KB
Volume
42
Category
Article
ISSN
0026-2714

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✍ Jordi Suñé; Ernest Wu 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 101 KB

A complete picture of breakdown is presented and compared with a full set of experiments. First, an analytical model for the breakdown statistics is proposed. This model is shown to have essentially the same predictive power as the percolation approach. Second, a hydrogen-based quantitative picture