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Analysis of structure and defects in thin silicon films deposited from hydrogen diluted silane

✍ Scribed by G. van Elzakker; V. Nádaždy; F.D. Tichelaar; J.W. Metselaar; M. Zeman


Book ID
108289270
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
292 KB
Volume
511-512
Category
Article
ISSN
0040-6090

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