✦ LIBER ✦

Analysis of reliability characteristics of high capacitance density MIM capacitors with SiO2–HfO2–SiO2 dielectrics

✍ Scribed by Sang-Uk Park; Chang-Yong Kang; Hyuk-Min Kwon; Byung-Seok Park; Won-Ho Choi; In-Shik Han; Gennadi Bersuker; Raj Jammy; Hi-Deok Lee

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

MIM Capacitors With Crystalline-$\hbox{T

✍ Wu, Yung-Hsien; Ou, Wei-Yuan; Lin, Chia-Chun; Wu, Jia-Rong; Wu, Min-Lin; Chen, L 📂 Article 📅 2012 🏛 IEEE 🌐 English ⚖ 379 KB

Reliability characteristics of high-K ga

✍ Dedong Han; Jinfeng Kang; Changhai Lin; Ruqi Han 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 146 KB

Highly reliable high-k gate dielectrics

✍ Kunihiko Iwamoto; Wataru Mizubayashi; Arito Ogawa; Toshihide Nabatame; Hideki Sa 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 271 KB

Time dependent dielectric breakdown char

✍ Toshihiro Matsuda; Takashi Ohzone; Takashi Hori 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 495 KB

Effective Modulation of Quadratic Voltag

✍ Jian-Jun Yang, ; Jing-De Chen, ; Wise, R.; Steinmann, P.; Ming-Bin Yu, ; Dim-Lee 📂 Article 📅 2009 🏛 IEEE 🌐 English ⚖ 409 KB

Dielectric Characteristics of Na2O · 3Si

✍ MASASUKE TAKATA; JOYCE E. MOLINELLI; MINORU TOMOZAWA; E. BRUCE WATSON 📂 Article 📅 1984 🏛 John Wiley and Sons 🌐 English ⚖ 401 KB