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Analysis of ion implanted silicon by RBS-channeling: influence of the damage model

✍ Scribed by M. Bianconi; E. Albertazzi; S. Balboni; G. Lulli


Book ID
113822888
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
273 KB
Volume
219-220
Category
Article
ISSN
0168-583X

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