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Analysis of interface states and series resistance of Ag/SiO2/n-Si MIS Schottky diode using current–voltage and impedance spectroscopy methods

✍ Scribed by Mustafa Okutan; Fahrettin Yakuphanoglu

Book ID: 111713382
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 381 KB
Volume: 85
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2007.11.011

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