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Analysis of Electrical Characteristics and Reliability Change of Zinc-Tin-Oxide Thin-Film Transistors by Photo-Thermal Treatment

✍ Scribed by Chen, Y.-C.; Chang, T.-C.; Li, H.-W.; Chung, W.-F.; Hsieh, T.-Y.

Book ID: 121695336
Publisher: The Electrochemical Society
Year: 2013
Tongue: English
Weight: 927 KB
Volume: 2
Category: Article
ISSN: 2162-8742
DOI: 10.1149/2.010309ssl

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