Environmental, Optical, and Electrical Stability Study of Solution-Processed Zinc–Tin–Oxide Thin-Film Transistors

✍ Scribed by Nayak, P.K.; Pinto, J.V.; Goncalves, G.; Martins, R.; Fortunato, E.

• Book ID: 115370166
• Publisher: Institute of Electrical and Electronics Engineers
• Year: 2011
• Tongue: English
• Weight: 256 KB
• Volume: 7
• Category: Article
• ISSN: 1551-319X
• DOI: 10.1109/JDT.2011.2160151