✦ LIBER ✦

An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories

✍ Scribed by Knaizuk, J., Jr.; Hartmann, C.R.P.

Book ID: 114605964
Publisher: IEEE
Year: 1977
Tongue: English
Weight: 780 KB
Volume: C-26
Category: Article
ISSN: 0018-9340
DOI: 10.1109/tc.1977.1674761

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Comments on "An Optimal Algorithm for Te

Comments on "An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories"

✍ Nair, R. 📂 Article 📅 1979 🏛 IEEE 🌐 English ⚖ 543 KB

An Algorithm for Testing Random Access M

An Algorithm for Testing Random Access Memories

✍ Knaizuk, J., Jr.; Hartmann, C.R.P. 📂 Article 📅 1977 🏛 IEEE 🌐 English ⚖ 537 KB

Linked faults in random access memories:

Linked faults in random access memories: concept, fault models, test algorithms, and industrial results

✍ Hamdioui, S.; Al-Ars, Z.; van de Goor, A.J.; Rodgers, M. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 689 KB

An algorithm to generate complete test s

An algorithm to generate complete test sets for stuck-at faults in combinational logic circuits

✍ Leonard J. Tung; David V. Kerns 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 581 KB

A new algorithm to generate test sets for stuck-at faults in combinational logic circuits via fault simulation is presented. The algorithm is non-path-sensitizing, non-pathtracing and can be easily implemented on a computer. The stuck-at fault model in the algorithm is developed using the component

Minimal March Tests for Detection of Dyn

Minimal March Tests for Detection of Dynamic Faults in Random Access Memories

✍ G. Harutunyan; V. A. Vardanian; Y. Zorian 📂 Article 📅 2007 🏛 Springer US 🌐 English ⚖ 321 KB

Efficient March Tests for a Reduced 3-Co

Efficient March Tests for a Reduced 3-Coupling and 4-Coupling Faults in Random-Access Memories

✍ Petru Caşcaval; Stuart Bennett; Corneliu Huţanu 📂 Article 📅 2004 🏛 Springer US 🌐 English ⚖ 548 KB