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Linked faults in random access memories: concept, fault models, test algorithms, and industrial results

✍ Scribed by Hamdioui, S.; Al-Ars, Z.; van de Goor, A.J.; Rodgers, M.


Book ID
117907153
Publisher
IEEE
Year
2004
Tongue
English
Weight
689 KB
Volume
23
Category
Article
ISSN
0278-0070

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