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An ion beam facility for HCI-based analysis and materials research

✍ Scribed by Günter Zschornack; Steffen Landgraf; Frank Großmann; Ulrich Kentsch; Vladimir P. Ovsyannikov; Mike Schmidt; Falk Ullmann

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 465 KB
Volume: 249
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2006.03.164

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